Invention Grant
- Patent Title: Capacitance measurement systems and methods
- Patent Title (中): 电容测量系统和方法
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Application No.: US11823982Application Date: 2007-06-29
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Publication No.: US07804307B1Publication Date: 2010-09-28
- Inventor: Louis Bokma , Andrew Best
- Applicant: Louis Bokma , Andrew Best
- Applicant Address: US CA San Jose
- Assignee: Cypress Semiconductor Corporation
- Current Assignee: Cypress Semiconductor Corporation
- Current Assignee Address: US CA San Jose
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
A first capacitor and a second capacitor are charged until voltage at the second capacitor settles to a settling voltage. While charging, the first capacitor is alternately switched between a current source and ground. When the settling voltage is reached, charging of the first capacitor is halted. The second capacitor continues to be charged until voltage at the second capacitor reaches a reference voltage. The amount of time it takes for the settling voltage to reach the reference voltage corresponds to a measure of capacitance on the first capacitor.
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