Invention Grant
- Patent Title: System and method for testing light-emitting devices
- Patent Title (中): 用于测试发光器件的系统和方法
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Application No.: US12429578Application Date: 2009-04-24
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Publication No.: US07804589B2Publication Date: 2010-09-28
- Inventor: I-Shih Tseng , Jeff Lee , Min-Hung Chang
- Applicant: I-Shih Tseng , Jeff Lee , Min-Hung Chang
- Applicant Address: TW Tao-Yuan Hsien
- Assignee: Chroma Ate Inc.
- Current Assignee: Chroma Ate Inc.
- Current Assignee Address: TW Tao-Yuan Hsien
- Agency: Rosenberg, Klein & Lee
- Priority: TW97210477U 20080613; TW97136723A 20080924
- Main IPC: G01J1/00
- IPC: G01J1/00 ; H01J3/14 ; H01J40/14

Abstract:
A method for testing light-emitting devices in a batch-wise, associated with a system for the same purpose, comprises the steps of: preparing the light-emitting devices on a moving carrier unit in a manner of aligning a predetermined longitudinal direction of the light-emitting devices with a predetermined transportation direction of the moving carrier unit, each of the light-emitting devices further having plural light-emitting elements; transporting orderly the light-emitting devices to pass a test area on a base of the system, in which the base energizes only the light-emitting elements within the test area; and, a solar cell module detecting continuously the energized light-emitting elements within the test area and further forming signals with respect to photo energy received in the test area.
Public/Granted literature
- US20090309606A1 SYSTEM AND METHOD FOR TESTING LIGHT-EMITTING DEVICES Public/Granted day:2009-12-17
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