Invention Grant
US07804755B2 Method for determining characteristics of signal and apparatus using the same
有权
用于确定信号和使用其的装置的特性的方法
- Patent Title: Method for determining characteristics of signal and apparatus using the same
- Patent Title (中): 用于确定信号和使用其的装置的特性的方法
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Application No.: US10979815Application Date: 2004-11-03
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Publication No.: US07804755B2Publication Date: 2010-09-28
- Inventor: Hyun-soo Park , Jae-wook Lee , Jae-seong Shim , Jung-hyun Lee , Eing-seob Cho , Eun-jin Ryu
- Applicant: Hyun-soo Park , Jae-wook Lee , Jae-seong Shim , Jung-hyun Lee , Eing-seob Cho , Eun-jin Ryu
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: NSIP Law
- Priority: KR10-2003-0079596 20031111; KR10-2004-0067191 20040825
- Main IPC: G11B7/00
- IPC: G11B7/00

Abstract:
A method of determining characteristics of a signal and an apparatus using the method. The apparatus for determining characteristics of a signal includes: a level detector receiving sample values of a radio frequency (RF) signal and binary data obtained by binarizing the RF signal, generating selection signals based on the binary data, classifying each of the sample values of the RF signal into one of a plurality of levels using the selection signals, and outputting average values of sample values of each level; and a signal characteristics determiner determining a characteristics value that indicates the characteristics of the RF signal using the average values of the sample values belonging to each level.
Public/Granted literature
- US20050128918A1 Method for determining characteristics of signal and apparatus using the same Public/Granted day:2005-06-16
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