Invention Grant
- Patent Title: Method and apparatus for determining asymmetry in an image
- Patent Title (中): 用于确定图像中不对称的方法和装置
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Application No.: US11662177Application Date: 2005-09-01
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Publication No.: US07805001B2Publication Date: 2010-09-28
- Inventor: Ihar Volkau , Wieslaw Lucjan Nowinski
- Applicant: Ihar Volkau , Wieslaw Lucjan Nowinski
- Applicant Address: SG Singapore
- Assignee: Agency for Science, Technology and Research
- Current Assignee: Agency for Science, Technology and Research
- Current Assignee Address: SG Singapore
- Agency: Dickstein Shapiro LLP
- Priority: SG200405043-1 20040910
- International Application: PCT/SG2005/000302 WO 20050901
- International Announcement: WO2006/028416 WO 20060316
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A method for determining asymmetry in an image such as an MR image of a brain comprises determining a symmetry plane to divide the image into a first part and a second part representative of, for example, the hemispheres of the brain. The probability distributions of voxels against intensities are determined for the first and second parts and histograms of intensities representative of the parts are generated. Compensation is made for any relative shift along a predetermined axis between the histograms. A divergence value based on a distance between the first and second histograms is then calculated and it is determined if the calculated divergence value is greater than a predetermined threshold. A divergence of greater than the predetermined threshold is indicative of asymmetry in the image that may be considered as suspicious for abnormality. There is also disclosed an apparatus for determining asymmetry in an image.
Public/Granted literature
- US20080095419A1 Method and Apparatus for Determining Asymmetry in an Image Public/Granted day:2008-04-24
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