Invention Grant
- Patent Title: Cross-ontological analytics for alignment of different classification schemes
- Patent Title (中): 跨本体分析用于校准不同的分类方案
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Application No.: US11493503Application Date: 2006-07-25
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Publication No.: US07805010B2Publication Date: 2010-09-28
- Inventor: Christian Posse , Antonio P Sanfilippo , Banu Gopalan , Roderick M Riensche , Robert L Baddeley
- Applicant: Christian Posse , Antonio P Sanfilippo , Banu Gopalan , Roderick M Riensche , Robert L Baddeley
- Agent Allan C. Tuan
- Main IPC: G06K9/62
- IPC: G06K9/62

Abstract:
Quantification of the similarity between nodes in multiple electronic classification schemes is provided by automatically identifying relationships and similarities between nodes within and across the electronic classification schemes. Quantifying the similarity between a first node in a first electronic classification scheme and a second node in a second electronic classification scheme involves finding a third node in the first electronic classification scheme, wherein a first product value of an inter-scheme similarity value between the second and third nodes and an intra-scheme similarity value between the first and third nodes is a maximum. A fourth node in the second electronic classification scheme can be found, wherein a second product value of an inter-scheme similarity value between the first and fourth nodes and an intra-scheme similarity value between the second and fourth nodes is a maximum. The maximum between the first and second product values represents a measure of similarity between the first and second nodes.
Public/Granted literature
- US20080025617A1 Methods and apparatuses for cross-ontologial analytics Public/Granted day:2008-01-31
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