Invention Grant
- Patent Title: Method and apparatus for measuring electric circuit parameters
- Patent Title (中): 测量电路参数的方法和装置
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Application No.: US11579866Application Date: 2005-05-13
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Publication No.: US07805265B2Publication Date: 2010-09-28
- Inventor: Akihiko Namba , Tetsuyoshi Ogura , Toru Yamada
- Applicant: Akihiko Namba , Tetsuyoshi Ogura , Toru Yamada
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2004-144809 20040514
- International Application: PCT/JP2005/008782 WO 20050513
- International Announcement: WO2005/111635 WO 20051124
- Main IPC: G01R27/06
- IPC: G01R27/06

Abstract:
A method for measuring electric circuit parameters of a 2-terminal circuit having first and second terminals, includes steps of: terminating one of the first and second terminals with a terminal impedance Z1, to measure reflection characteristics α1 for the other terminal; terminating one of the first and second terminals with a terminal impedance Z2 different from the terminal impedance Z1, to measure reflection characteristics α2 for the other terminal; terminating one of the first and second terminals with a terminal impedance Z3 different from the terminal impedances Z1 and Z2, to measure reflection characteristics α3 for the other terminal; and calculating electric circuit parameters of the 2-terminal circuit based on the resultant reflection characteristics α1, α2 and α3, whereby measuring electric circuit parameters, such as S-parameters, Z-parameters or the like, even of a DUT having a weak ground, in a simple way with high accuracy and low cost.
Public/Granted literature
- US20080004819A1 Method and Apparatus for Measuring Electric Circuit Parameters Public/Granted day:2008-01-03
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