Invention Grant
US07805273B2 Waveform generator, waveform generation apparatus, test apparatus and computer readable medium 失效
波形发生器,波形发生装置,测试装置和计算机可读介质

  • Patent Title: Waveform generator, waveform generation apparatus, test apparatus and computer readable medium
  • Patent Title (中): 波形发生器,波形发生装置,测试装置和计算机可读介质
  • Application No.: US12176429
    Application Date: 2008-07-21
  • Publication No.: US07805273B2
    Publication Date: 2010-09-28
  • Inventor: Makoto Kurosawa
  • Applicant: Makoto Kurosawa
  • Applicant Address: JP Tokyo
  • Assignee: Advantest Corporation
  • Current Assignee: Advantest Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Osha • Liang LLP
  • Priority: JP2007-192008 20070724
  • Main IPC: G01R35/02
  • IPC: G01R35/02
Waveform generator, waveform generation apparatus, test apparatus and computer readable medium
Abstract:
Provided is a waveform generating apparatus that generates analog signal based on fundamental waveform data including a predetermined number of samples, including: phase difference calculating section that calculates phase difference between the initial phase and final phase of a signal resulting from FSK-modulating, based on first set of modulation frequencies, input data sequence to be modulated onto a signal that the waveform generating apparatus generates; frequency calculating section that calculates correction frequency corresponding to quotient of dividing, by the predetermined number of samples, residue of dividing the phase difference by 2π; waveform producing section that produces fundamental waveform data representing a waveform corresponding to a signal resulting from FSK-modulating the input data sequence based on second set of modulation frequencies obtained by subtracting the correction frequency from the modulation frequencies in the first set; and output section that outputs a signal repeating the waveform represented by the fundamental waveform data.
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