Invention Grant
- Patent Title: Structure and methodology for characterizing device self-heating
- Patent Title (中): 表征设备自热的结构和方法
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Application No.: US11559120Application Date: 2006-11-13
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Publication No.: US07805274B2Publication Date: 2010-09-28
- Inventor: Ping-Chuan Wang , Paul A. Hyde , Kevin Kolvenbach , Giuseppe La Rosa
- Applicant: Ping-Chuan Wang , Paul A. Hyde , Kevin Kolvenbach , Giuseppe La Rosa
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Greenblum & Bernstein P.L.C.
- Agent Joseph P. Abate
- Main IPC: G01N25/20
- IPC: G01N25/20

Abstract:
A method comprises determining a poly-gate temperature for a given device and determining channel temperatures of monitor devices. The method further includes extrapolating channel temperatures of the monitor devices to obtain a channel temperature for the given device. The difference in temperature (ΔT value) is determined for the given device based on the poly-gate temperature and the channel temperature. A device comprises a heating device having a poly gate with at least one contact at each end thereof and a plurality of monitor device spaced at known distances from the heating device
Public/Granted literature
- US20080112458A1 STRUCTURE AND METHODOLOGY FOR CHARACTERIZING DEVICE SELF-HEATING Public/Granted day:2008-05-15
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