Invention Grant
US07807341B2 Method for forming organic mask and method for forming pattern using said organic mask
有权
用于形成有机掩模的方法和使用所述有机掩模形成图案的方法
- Patent Title: Method for forming organic mask and method for forming pattern using said organic mask
- Patent Title (中): 用于形成有机掩模的方法和使用所述有机掩模形成图案的方法
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Application No.: US11104553Application Date: 2005-04-13
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Publication No.: US07807341B2Publication Date: 2010-10-05
- Inventor: Shusaku Kido
- Applicant: Shusaku Kido
- Applicant Address: JP Kanagawa
- Assignee: NEC LCD Technologies, Ltd.
- Current Assignee: NEC LCD Technologies, Ltd.
- Current Assignee Address: JP Kanagawa
- Agency: Young & Thompson
- Priority: JP2004-119679 20040414
- Main IPC: G03F7/00
- IPC: G03F7/00

Abstract:
A method for forming an organic mask, includes: permeating an organic solvent into an organic pattern formed on a base film and containing at least one kind of organic material, by contacting the organic pattern with the organic solvent; and thereby, partially or entirely decreasing original adhesion strength between the base film and the organic pattern. A heat treatment may be conducted after contacting to adjust the adhesion strength. Using the organic pattern as a mask, isotropic etching is conducted. As a result, a desired taper angle of the etched base film can be achieved with high accuracy. The taper angle of the etched base film is adjustable by controlling the adhesion strength through the heat treatment.
Public/Granted literature
- US20050230348A1 Method for forming organic mask and method for forming pattern using said organic mask Public/Granted day:2005-10-20
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