Invention Grant
- Patent Title: Structure and method for FPN reduction in imaging devices
- Patent Title (中): FPN降低成像装置的结构和方法
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Application No.: US11137446Application Date: 2005-05-26
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Publication No.: US07808063B2Publication Date: 2010-10-05
- Inventor: Ulrich C. Boettiger , John Ladd
- Applicant: Ulrich C. Boettiger , John Ladd
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dickstein Shapiro LLP
- Main IPC: H01L29/04
- IPC: H01L29/04 ; H01L31/036 ; H01L31/00 ; H01L27/14
Abstract:
Imaging devices having reduced fixed pattern noise are disclosed. The fixed pattern noise in the imaging devices is reduced by measuring and adjusting the spectral characteristics of the imager device on a pixel by pixel basis. The fixed pattern noise of the pixel cells are changed by modifying the absorption, reflectance, refractive index, shape, and/or micro structure of the material.
Public/Granted literature
- US20060268143A1 Structure and method for FPN reduction in imaging devices Public/Granted day:2006-11-30
Information query
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