Invention Grant
- Patent Title: Systems and methods for detecting impurities in reactor systems
- Patent Title (中): 用于检测反应堆系统中杂质的系统和方法
-
Application No.: US11821602Application Date: 2007-06-25
-
Publication No.: US07808227B2Publication Date: 2010-10-05
- Inventor: Eric J. Markel , Robert O. Hagerty , Michael E. Muhle
- Applicant: Eric J. Markel , Robert O. Hagerty , Michael E. Muhle
- Applicant Address: US TX Houston
- Assignee: Univation Technologies, LLC
- Current Assignee: Univation Technologies, LLC
- Current Assignee Address: US TX Houston
- Main IPC: G01N27/00
- IPC: G01N27/00
Abstract:
The present invention is directed to various methods and systems for detecting at least one impurity in a bulk fluid. In certain embodiments, the methods are performed in conjunction with a polymerization reactor system such as a gas-phase reactor system.
Public/Granted literature
- US20080042655A1 Systems and methods for detecting impurities in reactor systems Public/Granted day:2008-02-21
Information query
