Provided is a test apparatus for testing the jitter tolerance of a device under test which receives a data signal and a strobe signal indicating the timing at which the data signal should be received, and acquires the data signal at the timing indicated by the strobe signal, including a signal generating section which generates the data signal and the strobe signal to be supplied to the device under test, a jitter applying section which applies a combinational jitter obtained by combining a data jitter which should be tolerated for the data signal and a strobe jitter which should be tolerated for the strobe signal to the data signal or the strobe signal, and a signal supplying section which supplies the data signal and the strobe signal, to one of which the combinational jitter has been applied, to the device under test.