Invention Grant
US07808253B2 Test method of microstructure body and micromachine 有权
微结构体和微机械的试验方法

Test method of microstructure body and micromachine
Abstract:
It is an object to provide a test method of a process, an electric characteristic, and a mechanical characteristic of a structure body in a micromachine without contact. A structure body including a first conductive layer, a second conductive layer provided in parallel to the first conductive layer, and a sacrifice layer or a space provided between the first conductive layer and the second conductive layer is provided; an antenna connected to the structure body is provided; electric power is supplied to the structure body wirelessly through the antenna; and an electromagnetic wave generated from the antenna is detected as a characteristic of the structure body.
Public/Granted literature
Information query
Patent Agency Ranking
0/0