Invention Grant
US07808270B2 Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuit
有权
用于半导体器件的输出电路，具有输出电路的半导体器件以及调整输出电路特性的方法
- Patent Title: Output circuit for semiconductor device, semiconductor device having output circuit, and method of adjusting characteristics of output circuit
- Patent Title (中): 用于半导体器件的输出电路，具有输出电路的半导体器件以及调整输出电路特性的方法
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Application No.: US12364296Application Date: 2009-02-02
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Publication No.: US07808270B2Publication Date: 2010-10-05
- Inventor: Hiroki Fujisawa
- Applicant: Hiroki Fujisawa
- Applicant Address: JP Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2005-011272 20050119
- Main IPC: H03K17/16
- IPC: H03K17/16 ; H03K19/003 ; H03B1/00
Abstract:
To decrease the circuit scale necessary for the calibration of the output circuit and to decrease the time required for the calibration operation. The invention includes a first output buffer and a second output buffer that are connected to a data pin, and a calibration circuit that is connected to a calibration pin. The first output buffer and the second output buffer include plural unit buffers. The unit buffers have mutually the same circuit structures. With this arrangement, the impedances of the first output buffer and the second output buffer can be set in common, based on the calibration operation using the calibration circuit. Consequently, both the circuit scale necessary for the calibration operation and the time required for the calibration operation can be decreased.
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