Invention Grant
- Patent Title: Aperture variable inspection optical system and color filter evaluation process
- Patent Title (中): 光圈可变检查光学系统和滤色片评估过程
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Application No.: US11896041Application Date: 2007-08-29
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Publication No.: US07808625B2Publication Date: 2010-10-05
- Inventor: Kenji Nakamura , Hisashi Shiraiwa
- Applicant: Kenji Nakamura , Hisashi Shiraiwa
- Applicant Address: JP Osaka
- Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee Address: JP Osaka
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2006-234057 20060830
- Main IPC: G01J1/00
- IPC: G01J1/00 ; G01N21/00

Abstract:
Disclosed is an aperture variable inspection optical system including a variable aperture unit 13 having a polygonal light transparent section and light collecting systems 12a, 12b for forming an irradiation spot U of light passing through the variable aperture unit 13 at the position of a sample S. The variable aperture unit 13 is capable of changing the shape/size of the polygon. The size of the irradiation spot U can be changed without rearranging the aperture unit.
Public/Granted literature
- US20080055592A1 Aperture variable inspection optical system and color filter evaluaton process Public/Granted day:2008-03-06
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