Invention Grant
- Patent Title: Method of calibrating an instrument, a self-calibrating instrument and a system including the instrument
- Patent Title (中): 校准仪器，自校准仪器和包括仪器的系统的方法
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Application No.: US12336553Application Date: 2008-12-17
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Publication No.: US07809518B2Publication Date: 2010-10-05
- Inventor: Miao Zhu , John C. Eidson
- Applicant: Miao Zhu , John C. Eidson
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: G01R35/00
- IPC: G01R35/00 ; G01R1/02
Abstract:
An instrument including a device, a transducer and a calibration module is disclosed. The device produces a reference time and/or a reference frequency. The transducer converts the reference time and/or the reference frequency to a reference signal. The calibration module adjusts an output signal generated by the instrument and/or a result of a measurement taken by the instrument, based on the reference signal. A system including the instrument and a method of calibrating the instrument are also disclosed.
Public/Granted literature
- US20100148757A1 METHOD OF CALIBRATING AN INSTRUMENT, A SELF-CALIBRATING INSTRUMENT AND A SYSTEM INCLUDING THE INSTRUMENT Public/Granted day:2010-06-17
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