Invention Grant
US07810066B2 Irradiation pattern data generation method, mask fabrication method, and plotting system 失效
照射图案数据生成方法,掩模制作方法和绘图系统

  • Patent Title: Irradiation pattern data generation method, mask fabrication method, and plotting system
  • Patent Title (中): 照射图案数据生成方法,掩模制作方法和绘图系统
  • Application No.: US11866699
    Application Date: 2007-10-03
  • Publication No.: US07810066B2
    Publication Date: 2010-10-05
  • Inventor: Tadao Yasuzato
  • Applicant: Tadao Yasuzato
  • Applicant Address: JP Tokyo
  • Assignee: Elpida Memory, Inc.
  • Current Assignee: Elpida Memory, Inc.
  • Current Assignee Address: JP Tokyo
  • Agency: Sughrue Mion, PLLC
  • Priority: JP2006-274779 20061006
  • Main IPC: G06F17/50
  • IPC: G06F17/50
Irradiation pattern data generation method, mask fabrication method, and plotting system
Abstract:
An irradiation pattern data generation method includes: a process for providing a design pattern having diagonal side portions that extend diagonally with respect to an X-axis direction and a Y-axis direction on an XY plane; a rectangular approximation process for approximating the design pattern to rectangles to generate a rectangular approximation pattern; a first correction process for shifting the side portions of the rectangular approximation pattern in the Y-axis direction to generate a first correction pattern; and a second correction process for enlarging the side portions of the first correction pattern in the X-axis direction and the Y-axis direction to generate an irradiation pattern.
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