Invention Grant
US07810066B2 Irradiation pattern data generation method, mask fabrication method, and plotting system
失效
照射图案数据生成方法,掩模制作方法和绘图系统
- Patent Title: Irradiation pattern data generation method, mask fabrication method, and plotting system
- Patent Title (中): 照射图案数据生成方法,掩模制作方法和绘图系统
-
Application No.: US11866699Application Date: 2007-10-03
-
Publication No.: US07810066B2Publication Date: 2010-10-05
- Inventor: Tadao Yasuzato
- Applicant: Tadao Yasuzato
- Applicant Address: JP Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2006-274779 20061006
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
An irradiation pattern data generation method includes: a process for providing a design pattern having diagonal side portions that extend diagonally with respect to an X-axis direction and a Y-axis direction on an XY plane; a rectangular approximation process for approximating the design pattern to rectangles to generate a rectangular approximation pattern; a first correction process for shifting the side portions of the rectangular approximation pattern in the Y-axis direction to generate a first correction pattern; and a second correction process for enlarging the side portions of the first correction pattern in the X-axis direction and the Y-axis direction to generate an irradiation pattern.
Public/Granted literature
- US20080149859A1 Irradiation Pattern Data Generation Method, Mask Fabrication Method, and Plotting System Public/Granted day:2008-06-26
Information query