Invention Grant
- Patent Title: Semiconductor device and semiconductor wafer and a method for manufacturing the same
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Application No.: US11834094Application Date: 2007-08-06
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Publication No.: US07812457B2Publication Date: 2010-10-12
- Inventor: Yoichiro Kurita
- Applicant: Yoichiro Kurita
- Applicant Address: JP Kanagawa
- Assignee: NEC Electronics Corporation
- Current Assignee: NEC Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Sughrue Mion, PLLC
- Priority: JP2004-194667 20040630
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/52 ; H01L29/40

Abstract:
The semiconductor device 1 has a semiconductor chip 10 (first semiconductor chip) and a semiconductor chip 20 (second semiconductor chip). The semiconductor chip 20 is formed on the semiconductor chip 10. The semiconductor chip 20 is constituted by comprising a semiconductor substrate 22. The semiconductor substrate 22, which is an SOI substrate, is constituted by comprising an insulating layer 34, and a silicon layer 36, which is provided on the insulating layer 34, including a circuit forming region A1. The insulating layer 34 functions as a protective film (a first protective film) covering a lower face (a face opposite to the semiconductor chip 10) of the circuit forming region A1. A protective film 38 (a second protective film) is provided on the semiconductor substrate 22. The protective film 38 covers a side face of the circuit forming region A1.
Public/Granted literature
- US20070278698A1 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR WAFER AND A METHOD FOR MANUFACTURING THE SAME Public/Granted day:2007-12-06
Information query
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