Invention Grant
- Patent Title: Packaging integrated circuits for high stress environments
- Patent Title (中): 包装用于高应力环境的集成电路
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Application No.: US12171189Application Date: 2008-07-10
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Publication No.: US07812463B2Publication Date: 2010-10-12
- Inventor: Felix C. Li
- Applicant: Felix C. Li
- Applicant Address: US CA Santa Clara
- Assignee: National Semiconductor Corporation
- Current Assignee: National Semiconductor Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Beyer Law Group LLP
- Main IPC: H01L23/29
- IPC: H01L23/29

Abstract:
One aspect of the invention pertains to a semiconductor package suitable for use in high stress environments, such as ones involving high pressures, temperatures and/or corrosive substances. In this aspect, a die and leadframe are fully encapsulated in a first plastic casing. The first plastic casing is fully encapsulated in turn with a second plastic casing. The two casings have different compositions. The first plastic casing, for example, may be made of a thermoset plastic material and the second plastic casing may be made of a thermoplastic material. The first plastic casing may have recesses, indentations and/or slots suitable for securing it to the second plastic casing. In some embodiments, a corrosion resistant coating is added to the second plastic casing. Methods for forming semiconductor packages suitable for use in high stress environments are also described.
Public/Granted literature
- US20100006991A1 PACKAGING INTEGRATED CIRCUITS FOR HIGH STRESS ENVIRONMENTS Public/Granted day:2010-01-14
Information query
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