Invention Grant
- Patent Title: Method for determining local deviations of a main magnetic field of a magnetic resonance device
- Patent Title (中): 用于确定磁共振装置的主磁场的局部偏差的方法
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Application No.: US12218708Application Date: 2008-07-17
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Publication No.: US07812603B2Publication Date: 2010-10-12
- Inventor: Dieter Ritter
- Applicant: Dieter Ritter
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: DE102007033874 20070720
- Main IPC: G01V3/00
- IPC: G01V3/00

Abstract:
The invention relates to a method for the determination of local deviations of a main magnetic field of a magnetic resonance device from a setpoint value, comprising: loading of a first image data record of an examination region recorded by means of the magnetic resonance device with a first frequency encoding gradient; loading of a second image data record of the same examination region recorded by means of the magnetic resonance device with a second frequency encoding gradient, with the first and the second frequency encoding gradient being different; reception of a transformation displacement field as the end result of a recording of the first and the second image data record; calculation of local deviations of the main magnetic field from a setpoint value on the basis of the calculated transformation displacement field; and display or storage of the calculated local deviations of the main magnetic field.
Public/Granted literature
- US20090021258A1 Method for determining local deviations of a main magnetic field of a magnetic resonance device Public/Granted day:2009-01-22
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