Invention Grant
US07813815B2 Digital measuring system and method for integrated circuit chip operating parameters
有权
数字测量系统及其集成电路芯片工作参数的方法
- Patent Title: Digital measuring system and method for integrated circuit chip operating parameters
- Patent Title (中): 数字测量系统及其集成电路芯片工作参数的方法
-
Application No.: US11557745Application Date: 2006-11-08
-
Publication No.: US07813815B2Publication Date: 2010-10-12
- Inventor: Herschel Ainspan , Philip G. Emma , Rick A. Rand , Arthur R Zingher
- Applicant: Herschel Ainspan , Philip G. Emma , Rick A. Rand , Arthur R Zingher
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: F. Chau & Associates, LLC
- Main IPC: G05B19/18
- IPC: G05B19/18 ; H02H5/04 ; G01R31/30 ; G01K7/00
Abstract:
An integrated circuit contains within the chip one or more measuring devices that provide a digital value corresponding to respective physical operating parameters of the chip. The digital values can be communicated to other devices using an interrupt handler.
Public/Granted literature
- US20070101227A1 DIGITAL MEASURING SYSTEM AND METHOD FOR INTEGRATED CIRCUIT CHIP OPERATING PARAMETERS Public/Granted day:2007-05-03
Information query
IPC分类:
