Invention Grant
US07814380B2 Built-in self test (BIST) architecture having distributed interpretation and generalized command protocol
有权
具有分布式解释和通用命令协议的内置自检（BIST）架构
- Patent Title: Built-in self test (BIST) architecture having distributed interpretation and generalized command protocol
- Patent Title (中): 具有分布式解释和通用命令协议的内置自检（BIST）架构
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Application No.: US12122702Application Date: 2008-05-18
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Publication No.: US07814380B2Publication Date: 2010-10-12
- Inventor: Roberto Fabian Averbuj , David W. Hansquine
- Applicant: Roberto Fabian Averbuj , David W. Hansquine
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Nicholas J. Pauley; Peter M. Kamarchik; Sam Talpalatsky
- Main IPC: G11C29/00
- IPC: G11C29/00
Abstract:
Built-in self-test (BIST) architecture having distributed interpretation and generalized command protocol is disclosed. In an embodiment, a system is disclosed and includes a centralized built-in self-test (BIST) controller configured to store an algorithm to test a plurality of memory modules. The BIST controller stores the algorithm as a set of generalized commands that conform to a command protocol. The BIST controller is configured to send the set of generalized commands to a sequencer.
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