Invention Grant
- Patent Title: Semiconductor device with channel stop trench and method
- Patent Title (中): 具有通道停止沟槽和方法的半导体器件
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Application No.: US12241701Application Date: 2008-09-30
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Publication No.: US07816229B2Publication Date: 2010-10-19
- Inventor: Franz Hirler
- Applicant: Franz Hirler
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Dicke, Billig & Czaja, P.L.L.C.
- Main IPC: H01L21/76
- IPC: H01L21/76

Abstract:
A semiconductor device is provided which includes a semiconductor substrate having a first surface, an active area and a peripheral area. The semiconductor device further includes least one channel stop trench formed in the semiconductor substrate, wherein the channel stop trench extends from the first surface at least partially into the semiconductor substrate and is arranged between the active area and the peripheral area. At least one electrode is arranged in the channel stop trench. The semiconductor substrate includes at least a peripheral contact region, which is arranged in the peripheral area at the first surface of the semiconductor substrate. A conductive layer is provided and in electrical contact with the electrode arranged in the channel stop trench and in electrical contact with the peripheral contact region. The conductive layer is electrically connected to the semiconductor substrate merely in the peripheral area and electrically insulated from the semiconductor substrate in the active area.
Public/Granted literature
- US20100078774A1 SEMICONDUCTOR DEVICE WITH CHANNEL STOP TRENCH AND METHOD Public/Granted day:2010-04-01
Information query
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