Invention Grant
- Patent Title: X-ray detector
- Patent Title (中): X射线探测器
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Application No.: US11743926Application Date: 2007-05-03
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Publication No.: US07816652B2Publication Date: 2010-10-19
- Inventor: Mathias Hörnig
- Applicant: Mathias Hörnig
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: King & Spalding L.L.P.
- Priority: DE102006021046 20060505
- Main IPC: G01T1/20
- IPC: G01T1/20

Abstract:
To reduce quality losses in edge areas of an X-ray image, caused by temperature fluctuations, an X-ray detector (1) is arranged with a scintillator (2) for converting X radiation into light and with an active matrix (3) of pixel readout elements, arranged behind it in the direction of X radiation, in such a manner that the active matrix (3) is shielded in an optically opaque manner with respect to the scintillator (2) in at least one edge area (6) of the cross-over area of the scintillator (2) and the active matrix (3); in particular, the optically opaque shielding is suitable for forming a dark reference zone (5) when the scintillator (2) is present.
Public/Granted literature
- US20070257196A1 X-RAY DETECTOR Public/Granted day:2007-11-08
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