Invention Grant
- Patent Title: Integrated circuit with a measuring circuit and method of configuring an integrated circuit with a measuring circuit
- Patent Title (中): 具有测量电路的集成电路和用测量电路配置集成电路的方法
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Application No.: US12107802Application Date: 2008-04-23
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Publication No.: US07816907B2Publication Date: 2010-10-19
- Inventor: Christoph Schwarzer , Holger Wenske , Mario Träber , Thomas Eichler , Marc Hesener , Armin Hanneberg , David Herbison
- Applicant: Christoph Schwarzer , Holger Wenske , Mario Träber , Thomas Eichler , Marc Hesener , Armin Hanneberg , David Herbison
- Applicant Address: DE Neubiberg
- Assignee: Lantiq Deutschland GmbH
- Current Assignee: Lantiq Deutschland GmbH
- Current Assignee Address: DE Neubiberg
- Agency: Coats & Bennett, P.L.L.C.
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
An integrated circuit includes an output terminal to be coupled to a light-emitting diode, an output circuit coupled to the output terminal, the output circuit being configured to supply an operating signal to the light-emitting diode, a measuring circuit coupled to the output terminal and a control circuit coupled to the measuring circuit. The measuring circuit is configured to sense on the output terminal a signal value outside an operating regime of the light-emitting diode, the signal value being a voltage below a forward voltage of the light-emitting diode or a current below a threshold current of the light-emitting diode. The control circuit is configured to configure at least one function of the integrated circuit when the signal value as sensed by the measuring circuit corresponds to a voltage below the forward voltage of the light-emitting diode or a current below the threshold current of the light-emitting diode.
Public/Granted literature
- US20090267681A1 Integrated Circuit and Method of Configuring an Integrated Circuit Public/Granted day:2009-10-29
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