Invention Grant
US07816931B2 Contact for electrical test, electrical connecting apparatus using it, and method of producing the contact
有权
用于电气测试的接触件,使用它的电气连接装置以及接触的制造方法
- Patent Title: Contact for electrical test, electrical connecting apparatus using it, and method of producing the contact
- Patent Title (中): 用于电气测试的接触件,使用它的电气连接装置以及接触的制造方法
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Application No.: US12388394Application Date: 2009-02-18
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Publication No.: US07816931B2Publication Date: 2010-10-19
- Inventor: Hideki Hirakawa , Takayuki Hayashizaki , Akira Soma , Yuko Yamada
- Applicant: Hideki Hirakawa , Takayuki Hayashizaki , Akira Soma , Yuko Yamada
- Applicant Address: JP Musahino-shi, Tokyo
- Assignee: Kabushiki Kaisha Nihon Micronics
- Current Assignee: Kabushiki Kaisha Nihon Micronics
- Current Assignee Address: JP Musahino-shi, Tokyo
- Agency: Ingrassia Fisher & Lorenz, P.C.
- Priority: JP2008-060927 20080311
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A contact comprises a contact body at least provided with an arm region extending in the right-left direction, and a tip region extending downward from the front end portion of the arm region. The tip region is provided with a pedestal portion integrally continuous to the lower edge portion on the front end side of the arm region, and a contact portion projecting downward from the lower end portion of the pedestal portion and having a tip to be brought into contact with an electrode of a device under test at the lower end. The pedestal portion includes an underside region having at least four inclined faces located around the contact portion when the tip region is seen from below, and inclined such that a portion closer to the side of the contact portion becomes lower.
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