Invention Grant
- Patent Title: Test system with high frequency interposer
- Patent Title (中): 高频插入式测试系统
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Application No.: US12070864Application Date: 2008-02-21
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Publication No.: US07816932B2Publication Date: 2010-10-19
- Inventor: Marc B. Cartier, Jr.
- Applicant: Marc B. Cartier, Jr.
- Applicant Address: US MA North Reading
- Assignee: Teradyne, Inc.
- Current Assignee: Teradyne, Inc.
- Current Assignee Address: US MA North Reading
- Agency: Wolf, Greenfield & Sacks, P.C.
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/26

Abstract:
An interposer with a conductive housing is disclosed. Conductive members pass through insulators positioned in openings in the conductive housing. The conductive housing may be grounded, providing a closely spaced ground structure for signal conductors passing through the conductive housing and therefore providing a desirable impedance to signals carried by the conductive members. Such an interposer may be used in a test system to couple high speed signals between instruments that generate or measure test signals and devices under test.
Public/Granted literature
- US20090212802A1 Test system with high frequency interposer Public/Granted day:2009-08-27
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