Invention Grant
US07816964B2 Pulse operated flip-flop circuit having test-input function and associated method
有权
具有测试输入功能和相关方法的脉冲触发电路
- Patent Title: Pulse operated flip-flop circuit having test-input function and associated method
- Patent Title (中): 具有测试输入功能和相关方法的脉冲触发电路
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Application No.: US12256244Application Date: 2008-10-22
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Publication No.: US07816964B2Publication Date: 2010-10-19
- Inventor: Min-Su Kim
- Applicant: Min-Su Kim
- Applicant Address: KR Suwon-Si, Gyeonggi-Do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Main IPC: H03K3/00
- IPC: H03K3/00

Abstract:
The pulse generation circuit generates a first pulse signal and a complementary second pulse signal. The first and second pulse signals are activated simultaneously in a normal mode and activated selectively in response to a test input signal in a test mode. A multiplexing input circuit selects and outputs one of a data input signal and a test input signal as a latch input signal in response to the first pulse signal and the second pulse signal. The latch input signal corresponds to the data input signal in the normal mode and corresponds to the test input signal in the test mode. The latching circuit latches the latch input signal to generate data output signal. The length of data transfer path is reduced, and DtoQ delay can be decreased.
Public/Granted literature
- US20090115481A1 PULSE OPERATED FLIP-FLOP CIRCUIT HAVING TEST-INPUT FUNCTION AND ASSOCIATED METHOD Public/Granted day:2009-05-07
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