Invention Grant
US07817076B2 Multiple mode digitization system for a non-destructive inspection instrument
有权
用于非破坏性检测仪器的多模式数字化系统
- Patent Title: Multiple mode digitization system for a non-destructive inspection instrument
- Patent Title (中): 用于非破坏性检测仪器的多模式数字化系统
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Application No.: US12192369Application Date: 2008-08-15
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Publication No.: US07817076B2Publication Date: 2010-10-19
- Inventor: Michael Drummy , Andrew Thomas , Denys Laquerre , David Larochelle , Pierre Langlois , Steven Besser
- Applicant: Michael Drummy , Andrew Thomas , Denys Laquerre , David Larochelle , Pierre Langlois , Steven Besser
- Applicant Address: US MA Waltham
- Assignee: Olympus NDT
- Current Assignee: Olympus NDT
- Current Assignee Address: US MA Waltham
- Agency: Ostrolenk Faber LLP
- Main IPC: H03M1/12
- IPC: H03M1/12

Abstract:
A multiple mode digitization system for a non-destructive inspection instrument which makes use of a multiplexing circuit and a single set of analog to digital converters to efficiently digitize analog test signals from a plurality of inputs. In the preferred embodiment, each of the analog to digital converters in the system is driven with an independent and separate clock signal, allowing for propagation delay compensation among the plurality of test signals as well as interleaved sampling such that custom sampling rates can be used for each input without the need for more than one clock frequency. In an alternate embodiment, phase adjustments on the sampling clocks are used only for interleave sampling, and digital filters are used to provide signal propagation delay compensation.
Public/Granted literature
- US20090045994A1 MULTIPLE MODE DIGITIZATION SYSTEM FOR A NON-DESTRUCTIVE INSPECTION INSTRUMENT Public/Granted day:2009-02-19
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