Invention Grant
- Patent Title: Optical three-dimensional measurement device and filter process method
- Patent Title (中): 光学三维测量装置和过滤方法
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Application No.: US12250703Application Date: 2008-10-14
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Publication No.: US07817287B2Publication Date: 2010-10-19
- Inventor: Tomoyuki Iizuka , Akihiro Fujii
- Applicant: Tomoyuki Iizuka , Akihiro Fujii
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz, Goodman & Chick, PC
- Priority: JP2007-303149 20071122
- Main IPC: G01B11/24
- IPC: G01B11/24

Abstract:
This is an optical three-dimensional measurement device provided with observation illumination light for illuminating an observation specimen, an object lens for collecting the observation light on the observation specimen and a display unit for displaying an observation image and its measurement result that are obtained via the object lens. The optical three-dimensional measurement device comprises a filter process determination unit for determining a first filter process on the basis of observation conditions used when taking in a three-dimensional image of the observation specimen and a filter process unit for applying the first filter process determined by the filter process determination unit to the measurement image or the measurement result.
Public/Granted literature
- US20090135433A1 OPTICAL THREE-DIMENSIONAL MEASUREMENT DEVICE AND FILTER PROCESS METHOD Public/Granted day:2009-05-28
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