Invention Grant
- Patent Title: Wired MIMO link tester
- Patent Title (中): 有线MIMO链路测试仪
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Application No.: US11951587Application Date: 2007-12-06
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Publication No.: US07817566B2Publication Date: 2010-10-19
- Inventor: Sung-Jun Lee , Jae-Ho Jung , Hyeong-Geun Park , Seong-Min Kim , Kwang-Chun Lee
- Applicant: Sung-Jun Lee , Jae-Ho Jung , Hyeong-Geun Park , Seong-Min Kim , Kwang-Chun Lee
- Applicant Address: KR Daejeon KR Gyeonggi-do
- Assignee: Electronics and Telecommunications Research Institute,Samsung Electronics Co., Ltd.
- Current Assignee: Electronics and Telecommunications Research Institute,Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Daejeon KR Gyeonggi-do
- Agency: Ladas & Parry LLP
- Priority: KR10-2006-0124832 20061208; KR10-2007-0120715 20071126
- Main IPC: G01R31/08
- IPC: G01R31/08

Abstract:
Provided is a wired Multiple-Input Multiple-Output (MIMO) link tester. The wired link tester, includes: a simulating unit for constructing a wired link corresponding to a wireless link for a multiple-input multiple-output system and simulating wireless-link characteristics using each variable element located on the wired link; and a control means for prestoring a predetermined value of the variable element depending on the state change time and the number of the state changes and controlling the variable element according to the predetermined value of the variable element.
Public/Granted literature
- US20080151763A1 WIRED MIMO LINK TESTER Public/Granted day:2008-06-26
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