Invention Grant
- Patent Title: Burn-in test socket having cover with floatable pusher
- Patent Title (中): 老化测试插座,带有可浮动推杆的盖子
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Application No.: US12288513Application Date: 2008-10-21
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Publication No.: US07828576B2Publication Date: 2010-11-09
- Inventor: Wei-Chih Lin , Hsiu-Yuan Hsu , Wen-Yi Hsieh
- Applicant: Wei-Chih Lin , Hsiu-Yuan Hsu , Wen-Yi Hsieh
- Applicant Address: TW Taipei Hsien
- Assignee: Hon Hai Precision Ind. Co., Ltd.
- Current Assignee: Hon Hai Precision Ind. Co., Ltd.
- Current Assignee Address: TW Taipei Hsien
- Agent Andrew C. Cheng; Wei Te Chung; Ming Chieh Chang
- Priority: TW96217633 20071022
- Main IPC: H01R13/62
- IPC: H01R13/62

Abstract:
A test socket comprising an insulative base with a plurality of contacts received in the base and a cover pivotally mounted to one end of the base. The cover comprises a pusher with an opening extending therethrough and a lid aligned with the pusher. The lid has a through hole corresponding to the opening of the pusher. Between the pusher and the lid have a plurality of elastic members for making the lid moveably with respect to the pusher.
Public/Granted literature
- US20090104807A1 Burn-in test socket having cover with floatable pusher Public/Granted day:2009-04-23
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