Invention Grant
- Patent Title: Photomask and method for forming wiring pattern using the same
- Patent Title (中): 光掩模和使用其形成布线图案的方法
-
Application No.: US11892082Application Date: 2007-08-20
-
Publication No.: US07829247B2Publication Date: 2010-11-09
- Inventor: Yoshinori Maeno
- Applicant: Yoshinori Maeno
- Applicant Address: JP Tokyo
- Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Rabin & Berdo, PC
- Priority: JP2006-268897 20060926
- Main IPC: G03F1/00
- IPC: G03F1/00 ; G03C5/00

Abstract:
A photomask includes a transparent mask substrate, and a plurality of square mask cells provided on the mask substrate. Each mask cell includes at least one of a light transmitting region and a light shielding region. A planar region (in which the mask cells are formed) of the mask substrate includes a first region, a second region surrounding the first region, and a third region outside the second region. The first region includes a first group of mask cells transmitting lights of a first light intensity greater than zero and less than or equal to 1. The second region includes a second group of mask cells transmitting lights of a second light intensity greater than zero and less than the first light intensity. The third region includes a third group of mask cells transmitting lights of a third light intensity greater than or equal to zero and less than the second light intensity.
Public/Granted literature
- US20080076041A1 Photomask and method for forming wiring pattern using the same Public/Granted day:2008-03-27
Information query