Invention Grant
- Patent Title: Integrated circuit package and fabricating method thereof
- Patent Title (中): 集成电路封装及其制造方法
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Application No.: US12694239Application Date: 2010-01-26
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Publication No.: US07829388B2Publication Date: 2010-11-09
- Inventor: Chin-Yung Chen , Chia-Hung Hsu , William Wang , Chung-Cheng Chou
- Applicant: Chin-Yung Chen , Chia-Hung Hsu , William Wang , Chung-Cheng Chou
- Applicant Address: TW Hsinchu
- Assignee: Raydium Semiconductor Corporation
- Current Assignee: Raydium Semiconductor Corporation
- Current Assignee Address: TW Hsinchu
- Priority: TW97101614A 20080116
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
The invention discloses an integrated circuit package. The integrated circuit package comprises a substrate having a first surface and a second surface opposite thereto and a first hole passing through the substrate from the first surface to the second surface. A plurality of conductive lines is disposed on a portion of the second surface of the substrate. A semiconductor chip is disposed above the second surface of the substrate, wherein a chamber is formed between the semiconductor chip and the substrate. A plurality of bonding pads are disposed on a side of the semiconductor chip which is toward the second surface of the substrate, wherein at least one of the bonding pads are electrically connected to one of the plurality of conductive lines. A first heat dissipation layer is disposed in the first hole, and extends into the chamber. A method for fabricating the integrated circuit package is also provided.
Public/Granted literature
- US20100129963A1 INTEGRATED CIRCUIT PACKAGE AND FABRICATING METHOD THEREOF Public/Granted day:2010-05-27
Information query
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