Invention Grant
- Patent Title: Manufacturing method of semiconductor device and manufacturing apparatus of the same
- Patent Title (中): 半导体器件的制造方法及其制造装置
-
Application No.: US12222891Application Date: 2008-08-19
-
Publication No.: US07829396B2Publication Date: 2010-11-09
- Inventor: Shunpei Yamazaki
- Applicant: Shunpei Yamazaki
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2007-217762 20070824
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/84

Abstract:
Instead of forming a semiconductor film by bonding a bond substrate (semiconductor substrate) to a base substrate (supporting substrate) and then separating or cleaving the bond substrate, a bond substrate is separated or cleaved at a plurality of positions to form a plurality of first semiconductor films (mother islands), and then the plurality of first semiconductor films are bonded to a base substrate. Subsequently, the plurality of first semiconductor films each are partially etched, whereby one or more second semiconductor films (islands) are formed using one of the first semiconductor films and a semiconductor element is manufactured using the second semiconductor films. The plurality of first semiconductor films are bonded to the base substrate based on a layout of the second semiconductor films so as to cover at least a region in which the second semiconductor films of the semiconductor element are to be formed.
Public/Granted literature
- US20090053876A1 Manufacturing method of semiconductor device and manufacturing apparatus of the same Public/Granted day:2009-02-26
Information query
IPC分类: