Invention Grant
- Patent Title: Method for manufacturing a SOI with plurality of single crystal substrates
- Patent Title (中): 制造具有多个单晶基板的SOI的方法
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Application No.: US12216553Application Date: 2008-07-08
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Publication No.: US07829431B2Publication Date: 2010-11-09
- Inventor: Koichiro Tanaka
- Applicant: Koichiro Tanaka
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2007-183906 20070713
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/301

Abstract:
A single-crystal semiconductor layer is provided in a large area over a large-sized glass substrate, whereby a large-scale SOI substrate is obtained. A single-crystal semiconductor substrate provided with an embrittlement layer and a dummy substrate are bonded to each other, and the single-crystal semiconductor substrate is separated at the embrittlement layer as a boundary by heat treatment to form a piece of single-crystal semiconductor over the dummy substrate. The dummy substrate is divided to form a piece of single-crystal semiconductor. The piece of single-crystal semiconductor is bonded to a supporting substrate, and the piece of single-crystal semiconductor is separated from the dummy substrate. Then, a plurality of pieces of single-crystal semiconductor are arranged and transferred to the large-sized glass substrate.
Public/Granted literature
- US20090017581A1 Method for manufacturing a semiconductor device Public/Granted day:2009-01-15
Information query
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