Invention Grant
- Patent Title: Method for manufacturing semiconductor device
- Patent Title (中): 制造半导体器件的方法
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Application No.: US12320827Application Date: 2009-02-05
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Publication No.: US07829470B2Publication Date: 2010-11-09
- Inventor: Tomohiko Doi
- Applicant: Tomohiko Doi
- Applicant Address: JP Chuo-ku, Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Chuo-ku, Tokyo
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2008-030512 20080212
- Main IPC: H01L21/302
- IPC: H01L21/302

Abstract:
A contact hole, after hole etching, is subjected to light etching using a process gas containing a fluorocarbon-based gas and oxygen, with the oxygen being enriched, under condition without applying bias. Then, reaction products (5) having C—F bond and adhered to an interior of a hole (3) are removed using plasma treatment. After that, deposits (4) that have been left at a hole bottom are removed by wet processing. Then, a conductive material is buried in the hole to form a contact plug (7).
Public/Granted literature
- US20090203207A1 Method for manufacturing semiconductor device Public/Granted day:2009-08-13
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