Invention Grant
- Patent Title: Semiconductor device and method of fabricating the same
- Patent Title (中): 半导体装置及其制造方法
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Application No.: US11966640Application Date: 2007-12-28
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Publication No.: US07829953B2Publication Date: 2010-11-09
- Inventor: Hyung Suk Jung , Jong-Ho Lee , Sung Kee Han , Ha Jin Lim
- Applicant: Hyung Suk Jung , Jong-Ho Lee , Sung Kee Han , Ha Jin Lim
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2007-0000279 20070102
- Main IPC: H01L29/72
- IPC: H01L29/72

Abstract:
A semiconductor device includes a semiconductor substrate including an NMOS region and a PMOS region, a gate insulating layer formed on the semiconductor substrate, an NMOS gate formed on the gate insulating layer of the NMOS region, and a PMOS gate formed on the gate insulating layer of the PMOS region. Any one of the NMOS gate and the PMOS gate includes a one-layered conductive layer pattern, and another of the NMOS gate and the PMOS gate includes a three-layered conductive layer pattern.
Public/Granted literature
- US20080150036A1 SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME Public/Granted day:2008-06-26
Information query
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