Invention Grant
US07830522B2 Method and apparatus for determining reflectance data of a subject
有权
用于确定被检体的反射率数据的方法和装置
- Patent Title: Method and apparatus for determining reflectance data of a subject
- Patent Title (中): 用于确定被检体的反射率数据的方法和装置
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Application No.: US11705195Application Date: 2007-02-12
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Publication No.: US07830522B2Publication Date: 2010-11-09
- Inventor: Jefferson Y. Han , Kenneth Perlin
- Applicant: Jefferson Y. Han , Kenneth Perlin
- Applicant Address: US NY New York
- Assignee: New York University
- Current Assignee: New York University
- Current Assignee Address: US NY New York
- Agent Ansel M. Schwartz
- Main IPC: G01N21/47
- IPC: G01N21/47 ; G01N21/55

Abstract:
An apparatus for obtaining reflectance data of an object includes a diffuser having a surface. The apparatus includes a mapping portion that effects a mapping between a light field at the object's surface and a light field at the diffuser surface for BRDF capture of the object. A method for obtaining reflectance data usable to determine a plurality of values of the BRDF of an object. The method includes the steps of illuminating the object. There is the step of effecting a mapping between a light field at the object's surface and a light field at a diffuser surface for BRDF capture of the object with a mapping portion. An apparatus and a method for measuring an 8D reflectance field of an object or a 3D object.
Public/Granted literature
- US20070216905A1 Method and apparatus for determining reflectance data of a subject Public/Granted day:2007-09-20
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