Invention Grant
- Patent Title: 3D image measuring apparatus and method thereof
- Patent Title (中): 3D图像测量装置及其方法
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Application No.: US11637040Application Date: 2006-12-12
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Publication No.: US07830528B2Publication Date: 2010-11-09
- Inventor: Kwangill Koh , Eun Hyoung Seong , Moon Young Jeon , Min Young Kim , Seung Jun Lee
- Applicant: Kwangill Koh , Eun Hyoung Seong , Moon Young Jeon , Min Young Kim , Seung Jun Lee
- Applicant Address: KR Seoul
- Assignee: Koh Young Technology, Inc.
- Current Assignee: Koh Young Technology, Inc.
- Current Assignee Address: KR Seoul
- Agency: Kile Park Goekjian Reed & McManus PLLC
- Agent Jae Y. Park
- Priority: KR10-2005-0123409 20051214; KR10-2005-0123412 20051214
- Main IPC: G01B11/24
- IPC: G01B11/24

Abstract:
A three dimensional (3D) measuring apparatus and method are provided. The 3D image measuring apparatus includes a stage, a projection portion, and an imaging portion. The projection portion includes first and second lights, first and second lattices, and first and second projection lenses. The imaging portion includes an imaging lens and a camera. The projection portion further includes a movement instrument which controls the first and the second lattices through a predetermined number of movement actions during operation of the measuring apparatus.
Public/Granted literature
- US20070133011A1 3D image measuring apparatus and method thereof Public/Granted day:2007-06-14
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