Invention Grant
- Patent Title: Total layer thickness detection apparatus, charging device, image forming apparatus, total layer thickness detection method and computer readable medium storing program for total layer thickness detection
- Patent Title (中): 总层厚度检测装置,充电装置,图像形成装置,总层厚度检测方法和用于总层厚度检测的计算机可读介质存储程序
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Application No.: US11987367Application Date: 2007-11-29
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Publication No.: US07831157B2Publication Date: 2010-11-09
- Inventor: Hidehiko Yamaguchi , Chikaho Ikeda , Hideki Moriya , Masao Ohmori
- Applicant: Hidehiko Yamaguchi , Chikaho Ikeda , Hideki Moriya , Masao Ohmori
- Applicant Address: JP Tokyo
- Assignee: Fuji Xerox Co., Ltd.
- Current Assignee: Fuji Xerox Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge PLC
- Priority: JP2007-165037 20070622
- Main IPC: G03G15/00
- IPC: G03G15/00

Abstract:
A total layer thickness detection apparatus for a charged body includes: a saturated charge amount detection unit that detects a saturated charge amount of a charged body having plural coating layers with mutually different relative dielectric constants; a storage unit that stores relation information indicating relation of change of the saturated charge amount of the charged body with respect to a change of layer thickness of a surface layer of the charged body; and a calculation part that calculates a total layer thickness of the plural coating layers of the charged body based on the change of the saturated charge amount detected by the saturated charge amount detection unit and the relation information stored in the storage unit.
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