Invention Grant
US07831415B1 Circuit for testing input signals and a method of testing input signals coupled to a circuit
有权
用于测试输入信号的电路和测试耦合到电路的输入信号的方法
- Patent Title: Circuit for testing input signals and a method of testing input signals coupled to a circuit
- Patent Title (中): 用于测试输入信号的电路和测试耦合到电路的输入信号的方法
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Application No.: US12035388Application Date: 2008-02-21
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Publication No.: US07831415B1Publication Date: 2010-11-09
- Inventor: Joe Eddie Leyba, II , Wayne E. Wennekamp , Schuyler E. Shimanek
- Applicant: Joe Eddie Leyba, II , Wayne E. Wennekamp , Schuyler E. Shimanek
- Applicant Address: US CA San Jose
- Assignee: Xilinx, Inc.
- Current Assignee: Xilinx, Inc.
- Current Assignee Address: US CA San Jose
- Agent John J. King
- Main IPC: G06F15/00
- IPC: G06F15/00

Abstract:
A method of testing input signals coupled to a circuit for performing a predetermined function is disclosed. The method comprises coupling input signals to inputs of the circuit by way of programmable interconnects; controlling the paths of the input signals within the circuit from the inputs to an output of the circuit; maintaining the states of the input signals coupled to the inputs of the circuit and routed to the output of the circuit; and testing output signals of the circuit to determine whether the correct input signals were provided to the inputs of the circuit by way of the programmable interconnects. A device having programmable logic which enables testing of input signals is also disclosed.
Information query