Invention Grant
- Patent Title: Parametric calibration method
- Patent Title (中): 参数校准方法
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Application No.: US11599940Application Date: 2006-11-14
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Publication No.: US07831417B2Publication Date: 2010-11-09
- Inventor: James M. Carrick , Mark R. Kennedy , Jeffrey D. Chismar
- Applicant: James M. Carrick , Mark R. Kennedy , Jeffrey D. Chismar
- Applicant Address: US CA San Diego
- Assignee: Gen-Probe Incorporated
- Current Assignee: Gen-Probe Incorporated
- Current Assignee Address: US CA San Diego
- Agent Michael J. Gilly
- Main IPC: G06F17/10
- IPC: G06F17/10

Abstract:
Method of preparing a calibration curve and determining the amount of an analyte polynucleotide present in a test sample, particularly using real-time amplification data. The method involves determining indicia of amplification for both the internal calibrator and analyte polynucleotide standards, each as a function of the amount of analyte polynucleotide standard input into the amplification reaction.
Public/Granted literature
- US20070111246A1 Parametric calibration method Public/Granted day:2007-05-17
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