Invention Grant
- Patent Title: MRI test fixture
- Patent Title (中): MRI测试夹具
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Application No.: US12316102Application Date: 2008-12-09
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Publication No.: US07834630B2Publication Date: 2010-11-16
- Inventor: Raymond V. Damadian , Hugh Wahl , Rein Aspelund , James Kelly
- Applicant: Raymond V. Damadian , Hugh Wahl , Rein Aspelund , James Kelly
- Applicant Address: US NY Melville
- Assignee: Fonar Corporation
- Current Assignee: Fonar Corporation
- Current Assignee Address: US NY Melville
- Agency: Kaye Scholer LLP
- Agent Brandon N. Sklar, Esq.
- Main IPC: G01V3/00
- IPC: G01V3/00

Abstract:
In one example, a magnetic resonance imaging (“MRI”) system comprises a magnetic resonance imaging assembly defining a gap region, a transmitting coil proximate the gap region, and at least one test coil separate from the transmitting coil. The at least one coil is mechanically coupled to the assembly during imaging and the at least one test coil is selectively electrically coupled to the assembly to collect test data. The at least one coil may be coupled to a test fixture coupled to the assembly. The test fixture may be deployable from a first position to a second position for collection of test data. The at least one coil may comprise a first test coil and a second test coil. Methods are also disclosed.
Public/Granted literature
- US20090167305A1 MRI test fixture Public/Granted day:2009-07-02
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