Invention Grant
- Patent Title: Semiconductor device for detecting a phase of a clock
- Patent Title (中): 用于检测时钟相位的半导体器件
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Application No.: US12327112Application Date: 2008-12-03
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Publication No.: US07834664B2Publication Date: 2010-11-16
- Inventor: Sang-Sic Yoon , Kyung-Hoon Kim
- Applicant: Sang-Sic Yoon , Kyung-Hoon Kim
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynis Semiconductor Inc.
- Current Assignee: Hynis Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2008-0067176 20080710
- Main IPC: G01R25/00
- IPC: G01R25/00 ; H03D13/00

Abstract:
A semiconductor, which includes a first phase detecting unit configured to detect a phase of a second clock on the basis of a phase of a first clock, and generate a first detection signal corresponding to a result of the detection, a second phase detecting unit configured to detect a phase of a delayed clock, which is generated by delaying the second clock by a predetermined time, on the basis of the phase of the first clock, and generate a second detection signal corresponding to a result of the detection, and a logic level determining unit configured to determine a logic level of a feedback output signal according to the first detection signal, the second detection signal and the feedback output signal.
Public/Granted literature
- US20100007372A1 SEMICONDUCTOR DEVICE Public/Granted day:2010-01-14
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