Invention Grant
US07834786B2 Sample hold circuit for use in time-interleaved A/D converter apparatus including paralleled low-speed pipeline A/D converters
有权
采样保持电路,用于并行低速流水线A / D转换器的时间交织A / D转换装置
- Patent Title: Sample hold circuit for use in time-interleaved A/D converter apparatus including paralleled low-speed pipeline A/D converters
- Patent Title (中): 采样保持电路,用于并行低速流水线A / D转换器的时间交织A / D转换装置
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Application No.: US12436289Application Date: 2009-05-06
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Publication No.: US07834786B2Publication Date: 2010-11-16
- Inventor: Shoji Kawahito , Zheng Liu , Yasuhide Shimizu , Kuniyuki Tani , Akira Kurauchi , Koji Sushihara , Koichiro Mashiko
- Applicant: Shoji Kawahito , Zheng Liu , Yasuhide Shimizu , Kuniyuki Tani , Akira Kurauchi , Koji Sushihara , Koichiro Mashiko
- Applicant Address: JP Kanagawa
- Assignee: Semiconductor Technology Academic Research Center
- Current Assignee: Semiconductor Technology Academic Research Center
- Current Assignee Address: JP Kanagawa
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2008-121938 20080508
- Main IPC: H03M1/10
- IPC: H03M1/10

Abstract:
A sample hold circuit is provided for use in a time-interleaved A/D converter apparatus including a plurality of low-speed pipeline A/D converters which are parallelized. The sample hold circuit includes a sampling capacitor and a sample hold amplifier, and operates to sample and hold an input signal by using a switched capacitor. An adder circuit of the sample hold circuit adds a ramp calibration signal to the input signal, by inputting the ramp calibration signal generated to have a frequency identical to that of a sampling clock signal and a predetermined slope based on the sampling clock signal, into a sample hold amplifier via a calibration capacitor having a capacitance smaller than that of the sampling capacitor.
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