Invention Grant
- Patent Title: Attention level measuring apparatus and an attention level measuring system
- Patent Title (中): 注意度测量仪和注意力测量系统
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Application No.: US11737159Application Date: 2007-04-19
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Publication No.: US07834912B2Publication Date: 2010-11-16
- Inventor: Tomoaki Yoshinaga , Shigeki Nagaya , Youichi Horii
- Applicant: Tomoaki Yoshinaga , Shigeki Nagaya , Youichi Horii
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Antonelli, Terry, Stout & Kraus, LLP.
- Priority: JP2006-115152 20060419
- Main IPC: H04N5/228
- IPC: H04N5/228

Abstract:
An attention level measuring apparatus, including: an eye direction measurement unit, which is configured to input image data and to measure an eye direction of a person photographed; an attention position information calculate unit, which is configured to calculate attention position information of a person, from the eye direction measured by an eye direction measurement unit; a person-attention-level calculate unit, which is configured to calculate person-attention-level information regarding a person-attention-level parameter about an attention target of a person, with using the attention position information calculated by the attention position information calculate unit; and an output control unit, which is configured to display graphic information produced upon basis of the calculated attention level information and a picture of the attention target, putting one upon the other.
Public/Granted literature
- US20070247524A1 Attention Level Measuring Apparatus and An Attention Level Measuring System Public/Granted day:2007-10-25
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