Invention Grant
- Patent Title: Position measuring arrangement
- Patent Title (中): 位置测量装置
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Application No.: US12284127Application Date: 2008-09-18
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Publication No.: US07835014B2Publication Date: 2010-11-16
- Inventor: Elmar Mayer , Johann Oberhauser
- Applicant: Elmar Mayer , Johann Oberhauser
- Applicant Address: DE Traunreut
- Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee Address: DE Traunreut
- Agency: Brinks Hofer Gilson & Lione
- Priority: DE102007045362 20070922
- Main IPC: G01B11/14
- IPC: G01B11/14 ; G01D5/34

Abstract:
A method for absolute position measuring that includes scanning a code having code elements arranged one behind the other in a measuring direction, wherein the code elements include sequential first and second code elements which define a code word containing absolute position information. The method including generating scanning signals within the first code elements and the second code elements. The method further including forming information regarding the sequential first and second code elements from the scanning signals via a reference value and determining the reference value as a function of at least one of the scanning signals within the first code elements and the scanning signals within the second code elements.
Public/Granted literature
- US20090079996A1 Position measuring arrangement Public/Granted day:2009-03-26
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