Invention Grant
- Patent Title: Method to automatically identify and compensate for substrate differences using a sensor
- Patent Title (中): 使用传感器自动识别和补偿基板差异的方法
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Application No.: US11125897Application Date: 2005-05-02
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Publication No.: US07835036B2Publication Date: 2010-11-16
- Inventor: Lalit K. Mestha , Raja Bala , Reiner Eschbach
- Applicant: Lalit K. Mestha , Raja Bala , Reiner Eschbach
- Applicant Address: US CT Norwalk
- Assignee: Xerox Corporation
- Current Assignee: Xerox Corporation
- Current Assignee Address: US CT Norwalk
- Agent Richard H. Krukar; Luis M. Ortiz; Kermit D. Lopez
- Main IPC: H04N1/40
- IPC: H04N1/40 ; H04N1/46 ; G03F3/08

Abstract:
Identifying the substrate type of a target substrate before patterning by a marking engine produces an opportunity to adjust the marking engine. The adjustments can enable the marking engine to produce higher quality work. The target substrate's substrate type can be automatically identified by obtaining its characteristics and submitting them to a classifier. A spectrophotometer can measure a substrates reflectance spectrum, which is a good characteristic for use in classifying. Classifiers can be based on known distance or correlation measures.
Public/Granted literature
- US20060244968A1 Method to automatically identify and compensate for substrate differences using a sensor Public/Granted day:2006-11-02
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