Invention Grant
- Patent Title: Semiconductor memory apparatus having decreased leakage current
- Patent Title (中): 具有减小的漏电流的半导体存储装置
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Application No.: US12407326Application Date: 2009-03-19
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Publication No.: US07835216B2Publication Date: 2010-11-16
- Inventor: Yun Seok Hong
- Applicant: Yun Seok Hong
- Applicant Address: KR Kyoungki-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Kyoungki-do
- Agency: Ladas & Parry LLP
- Priority: KR10-2008-0112321 20081112
- Main IPC: G11C5/14
- IPC: G11C5/14

Abstract:
A semiconductor memory apparatus includes a MOS transistor configured to be supplied with a first voltage through a bulk terminal thereof. The semiconductor memory apparatus also includes a current control unit configured to be connected to a source terminal of the MOS transistor, receive a power down mode enable signal and a self refresh mode enable signal, apply a second voltage to the source terminal during a power down mode or a self refresh mode, and apply the first voltage to the source terminal during modes other than the power down mode and the self refresh mode.
Public/Granted literature
- US20100118638A1 SEMICONDUCTOR MEMORY APPARATUS HAVING DECREASED LEAKAGE CURRENT Public/Granted day:2010-05-13
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